产品列表

电路板反求系统 RE1024电路板反求系统 电路板故障检测产品 BM8600电路板故障诊断工作站 BM8500电路板故障诊断工作站 BM8400电路板故障检测仪 BM8300电路板故障诊断系统 BM8200电路板故障检测仪 ABI-6400电路板故障检测仪 ABI-6500电路板故障检测仪 ABI-3400三维立体阻抗分析仪 ABI-2400电路板故障检测仪 ABI-2500电路板故障检测仪 DT5000C电路板故障检测仪 ABI-6350八合一多功能仪表 ABI-1100可编程电源 集成电路检测产品 AT192全品种集成电路测试仪 AT256全品种集成电路测试仪 LinearMaster集成电路测试仪 ChipMaster集成电路测试仪

您所在的位置:首页 > 测试案例 > 某厂计量处失效元件-CD54HC14F3A测试报告

某厂计量处失效元件-CD54HC14F3A测试报告

 

AT256 - Chip Report

 

Test Summary

 

Device: 008
Package: 14 pin DIL narrow
Scan Profile: Low V Digital
Overall Result: FAIL
Operator: Administrator
Report Date: 18 October 2011

 

Pin Summary
Pin Diagram

SUCCESS Pins

Pin 7: 100 % Match

SUSPECT Pins

Pin 1: 71 % Match
Pin 2: 69 % Match
Pin 3: 71 % Match
Pin 4: 68 % Match
Pin 5: 71 % Match
Pin 6: 69 % Match
Pin 8: 69 % Match
Pin 9: 72 % Match
Pin 10: 68 % Match
Pin 11: 63 % Match
Pin 13: 72 % Match
Pin 14: 64 % Match

FAIL Pins

Pin 12: 3 % Match

 

Detailed Pin Analysis
Pin 7:
SUCCESS
Pin signature for 7
Pin 1:
SUSPECT
Pin signature for 1
Pin 2:
SUSPECT
Pin signature for 2
Pin 3:
SUSPECT
Pin signature for 3
Pin 4:
SUSPECT
Pin signature for 4
Pin 5:
SUSPECT
Pin signature for 5
Pin 6:
SUSPECT
Pin signature for 6
Pin 8:
SUSPECT
Pin signature for 8
Pin 9:
SUSPECT
Pin signature for 9
Pin 10:
SUSPECT
Pin signature for 10
Pin 11:
SUSPECT
Pin signature for 11
Pin 13:
SUSPECT
Pin signature for 13
Pin 14:
SUSPECT
Pin signature for 14
Pin 12:
FAIL
Pin signature for 12